PRODUCT DESCRIPTION
產品介紹
PRODUCT DESCRIPTION
NeoKGD是一個標準測試平台，通過靈活的配置選項，滿足客戶在KGD測試和分類方面的需求。從測試條件(環境、溫度、靜態和動態測試)到探針技術(探針卡)，NeoKGD能夠根據客戶的要求提供適合的設置，以達到高效、精準的良品輸出及不良品分選。
FEATURES
產品特色
FEATURES
每小時高達1,800個單位的高吞吐量設計
配備高速光學檢測系統，能夠於晶粒針測及最終測試(高溫或環境溫度)進行自動分選
佔地面積小，提升廠房空間利用率
PRODUCT SPECIFICATIONS
產品規格
PRODUCT SPECIFICATIONS
| KGD 測試分類機 - NeoKGD | ||
|---|---|---|
| Input Media | 6”, 8” or 12” Wafer Frame | |
| Output Media |
Reconstructed Wafer Frame 2”, 4” Waffle and Gel Pack Tape & Reel Jedec or Custom Tray form |
|
| Reject Media |
Bin Boxes 2”, 4” Waffle and Gel Pack |
|
Supported Tests |
AC, DC, Hi-Pot Test | |
| Temperature Control |
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| Optical Inspection | 5s, 6s, Hi-Speed Capabilities | |
| Probe Card Features |
Automatic Alignment (Probe Needles and Die) Automatic Cleaning Embedded Locking System with ATE Direct Docking Capability |
|
| Factory Integration |
SECS/GEM Interface Wafer Map Management (according to the SEMI standards) Lights-off concept ready (Robotization, AGVs) |
|
| Equipment KPIs |
Compact footprint Overall Equipment Efficiency (OEE) : ≥ 92% Mean time between failures (MTBF): ≥ 1,680 hours Jam rate : ≤ 1:10k Conversion time between product/packages ≤ 15 mins Mean time to assist (MTTA) in Production Mode: less than 3 minutes for hard jam only |
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