Pressure Sensor Test System - AIOLOS
AEM AFORE's pressure sensor test system, AIOLOS, offers automated probing from development labs to high volume production. For probing of diced wafers on wafer-frames the AIOLOS comes with the innovative active alignment feature to maximize the number of devices under test in one touch-down.
PRODUCT DESCRIPTION
PRODUCT DESCRIPTION
AEM AFORE provides state-of-the-art test solutions designed specifically for MEMS, including wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. Unlike traditional Pick & Place methods, the AIOLOS utilizes a ring frame for testing, which prevents component damage and enhances production efficiency. AEM AFORE's solutions enable customers to conduct wafer-level final tests in advanced Chip Scale Packaging (CSP), simplifying manufacturing processes and minimizing testing costs.
FEATURES
FEATURES
Caters for up to 200mm wafers and wafer-frames
Allows both robotic and manual loading
Offers a range of temperature options that allow testing at automotive grade temperature levels
The standard configuration supports pressure levels from standard vacuum to 2.000hPa(abs) at Pa level resolution
Optional high vacuum and high-pressure versions
Optional probers
FUNCTION DESCRIPTION
FUNCTION DESCRIPTION
The AIOLOS inertial sensor wafer probe system can be used for the final testing and calibration of:
Pressure and vacuum sensors
Gas and humidity sensors
Electronic devices requiring characteristic test in vacuum and other atmospheric environments
EXPLORE MORE
