NI SET - IOL and Power Cycling Test Systems

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IOL & Power Cycling Test Systems

NI SET IOL & Power Cycling Test System is relevant for silicon-based as well as SiC and GaN power semiconductors, increasing measurement quality and throughput while reducing test costs on an open platform. This enables seamless monitoring and precise determination of all parameters of each DUT.

PRODUCT DESCRIPTION

To meet the lifetime of power semiconductors in compliance with test standards like AQG 324 and AECQ-101, engineers perform intermittent operational life (IOL) and power cycling tests where the DUTs are switched on and off continuously to thermally stress them at the chip-near joins.

NI SET IOL and Power Cycling Test System not only meets test standards like AQG 324 and AECQ-101 but also achieves high throughput, high efficiency, and high measurement quality, ensuring that engineers can effectively enhance testing efficiency.

ADVANTAGES

Seamless monitoring and precise determination of all parameters of each DUT

Capturing every single stress pulse with full recording capabilities in a fully automated process, complete with comprehensive characterization

Testing in accordance with AQG 324 and AECQ-101 test guidelines

Open test platform, suitable for testing silicon as well as SiC and GaN power semiconductors

Multiple drawers compatible with standard housings, along with custom adaptations for diverse substrates

FUNCTION DESCRIPTION

Intermittent Operational Life (IOL)

Testing discretes with loads up to 150A

Up to 80 channels per system, 8 channels per drawer

Monitoring parameter: Tc, Iload, Vload, VReverse (VF), Rth, Tvj (Tjmax – Tjmin)

The test system is MIL-STD-750D compliant