Nano Probes
The nanoprobe is an essential tool for electrical characteristics measurement in advanced semiconductor manufacturing processes. It is widely used in research and development stages as well as for failure analysis.
PRODUCT DESCRIPTION
PRODUCT DESCRIPTION
The nanoprobe is widely used in research and development stages as well as for failure analysis.
As processes have progressed to 10nm and below, the requirements for probe specifications have become increasingly demanding. ALES TECH is capable of providing high-quality nanoprobes, with the probe tip positioned within 50nm and a probe diameter smaller than 30nm, meeting the demands for failure analysis in 3nm manufacturing processes.
FEATURES
FEATURES
Widely used in research and development stages as well as for failure analysis
The diameter of the probe at the tip position is less than 30nm
Capable of meeting the demands for failure analysis in 3nm manufacturing processes
