Multi Purpose Frame/Wafer Probe System - MPP
AEM AFORE's multi purpose frame/wafer probe system, the AFORE MPP offers automated probing from development lab to high volume production. The modular design of MPP allows test of a wide range of devices, for example thermal sensors stimulated with a black body source.
PRODUCT DESCRIPTION
PRODUCT DESCRIPTION
AEM AFORE provides state-of-the-art test solutions designed specifically for MEMS, including wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. Unlike traditional Pick & Place methods, the AFORE MPP utilizes a ring frame for test, which prevents component damage and enhances production efficiency. AEM AFORE's solutions enable customers to conduct wafer-level final test in advanced Chip Scale Packaging (CSP), simplifying manufacturing processes and minimizing testing costs.
FEATURES
FEATURES
Caters for up to 200mm wafers and wafer-frames
Allows both robotic and manual loading
With the innovative active alignment feature to maximize the number of devices under test in one touch-down
Offers a range of temperature options that allow testing at automotive grade temperature levels
Optional probers
FUNCTION DESCRIPTION
FUNCTION DESCRIPTION
AEM AFORE's multipurpose frame/wafer probe system, the AFORE MPP, is suitable for the final testing and calibration of:
Magnetometers and other semiconductor electronic devices
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