Mass Production Test Handler for MEMS
OSAI Neo Handler is first class equipment for testing semiconductor MEMS sensor components. Its small footprint (900 x 1600 mm) and scalable architecture enable significant reductions in test costs. High flexibility, along with various combinations of I/O feeding options (from direct die to tube feeding), provides a high-end test handler solution with low operational and investment costs.
FEATURES
FEATURES
High flexibility for different MEMS stimulus
Conceived for maximizing throughput for different MEMS response time
Scalable Multisite available x1, x4, x8, x16, x35, x70, x140
Fully sensorized heads for high sensitivity pick/place
Optical camera for position check and 2D code reading
Trolley for fast input/output setup change (Jedec Tray, T&R, Bowl, Tube, Film frame)
FUNCTION DESCRIPTION
FUNCTION DESCRIPTION
【Application Packaging】
BGA & Ubga
QFP
SO-16/32
KMA
TO-220 / TO-247
LGA
DIP 8 or 16 (300 mils)
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