Inertial Sensor Wafer Probe System - KRONOS
AEM AFORE's inertial sensor wafer probe system, KRONOS, is a specialized probe station designed for precise testing and calibration of gyroscopes and accelerometers. The probe stations’ sturdy structure enables probing, testing, and stepping in any orientation or during rotation with high positioning accuracy. It uses unique mechanics placed in a dual-axis turning unit with infinite rotation.
PRODUCT DESCRIPTION
PRODUCT DESCRIPTION
AEM AFORE provides state-of-the-art test solutions specifically designed for MEMS, including wafer and frame probing stations suitable for R&D, wafer sort, and final test. Unlike traditional pick-and-place methods, the KRONOS utilizes a ring frame for testing, preventing component damage and enhancing production efficiency. AEM AFORE's solutions enable customers to conduct wafer-level final tests in advanced chip-scale packaging (CSP), simplifying manufacturing processes and reducing testing costs.
FEATURES
FEATURES
Handles wafer sizes up to 200mm
High multisite test capability
Enables fast automatic loading of wafers or frames from cassette to prober and back
Optional temperature chuck systems and probers
FUNCTION DESCRIPTION
FUNCTION DESCRIPTION
The KRONOS inertial sensor wafer probe system can be used for the final testing and calibration of：
Accelerometers
Magnetometers
Gyroscopes
e-Compass
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