Spirox and NI will Jointly Exhibit at the 2025 JFS Conference and Compound Semiconductor Industry Expo

This year’s exhibition is themed “Enable a Better Future”, focusing on cutting-edge technologies, industry trends, and future applications in the compound semiconductor field.

Spirox will team up with NI to showcase our self-developed Spirox Laser Tomography Scanning System, along with the latest Power Semiconductor Reliability Testing System at booth 2A17 in Hall A2 of Wuhan Optics Valley Technology Exhibition Center. We aim to support compound semiconductor manufacturing and quality control, enabling customers to monitor critical yield indicators and process risks in real time, enhancing process efficiency and product competitiveness.