QE System
The CMOS QE test platform can control the wavelength of the light source and add a frame grabber card to perform QE testing. It can control the incident angle of light to obtain analysis data from different angles of the part.
FEATURES
FEATURES
Sensor placement platform
Angular response measurement solution
Support spectrometer for QE measurement
Contains light source correction function
PRODUCT SPECIFICATIONS
PRODUCT SPECIFICATIONS
| QE System Specification | ||
|---|---|---|
| Light Intensity Control | 100 - 30 (steps) | |
| F-number | F/4.6 | |
| Wavelength Range | 350 -1800nm (Effective Range) | |
|
Placement Platform Movement |
X - Electric Control | ±12.5mm / 0.01mm |
| Y - Electric Control | 4-3 | |
| Z - Electric Control | 4-3 | |
| Placement Platform Rotation | Electric Control | Coarse Adjustment ±90° / 0.1° Fine Adjustment 360° / 0.1° |
| Light Source Adjustment Capability | Z - Manual Control | 140mm |
| Automation Integration Capability | Infrared Auto-Alignment of Sensor Axes Rotation Control |
|
