Light Sensor Tester
Incorporate the Handler feeding mechanism into two turntables, thereby increasing UPH production. Additionally, implement an independent three-station project. In engineering mode, enable single-button serial testing for three stations: open-air, gray card, and light source. Alternatively, allow for parallel testing at all three stations: all open-air, all gray card, and all light source, to simulate production mode test results.
PRODUCT DESCRIPTION
PRODUCT DESCRIPTION
FEATURES
FEATURES
Includes open-circuit testing, gray card testing, and dark/light environment testing
Supports multi-site testing to ensure synchronized operations across stations, enhancing efficiency
Offers flexible testing modes, supporting both single-site and multi-site loop testing
Each test station features independent program control for greater flexibility
Enables data sharing and transmission between stations for seamless integration and analysis
Equipped with a high-performance digital board featuring a 100 MHz clock, PPMU (Precision Measurement Unit), and active load function
Compatible with communication protocols such as I2C and SPI to meet diverse testing needs
Integrates test reports from all stations into a single user interface for simplified operations
Supports handler integration to deliver a complete automated testing solution
PRODUCT SPECIFICATIONS
PRODUCT SPECIFICATIONS
| Digital Board Specification | |
|---|---|
| Channel Count | 32 |
|
LVM (Launch Vector Memory) |
123M vector |
|
HCM (History Capture Memory) |
123M vector |
| Fall Log Memory | Pure pass / fall can reach 128M |
| Max Vector Rate | 100MHz |
|
Vector Period Range |
10ns to 40us (100MHz to 25kHz) |
|
Voltage Range |
-2V - 6.5V |
| Current Range |
|
