CIS WLBS Tester
CIS WLBS Tester is a CIS characteristic testing machine that can control the light source for QE testing. It also has a large memory space to support LAG and Temporal Noise measurements. It is equipped with 32 channels of SMU and can set different power supplies for CIS product characteristic analysis.
FEATURES
FEATURES
Support DVP Test (100MHz pixel clock)
Support MIPI Test (4 lane, up to 1.5G/per lane) x2
Support FPGA Image Processing
Support SPAD (Single Photon Avalanche Diode) Test
Support Spectrometer to QE Measurement
Support Light Source Correction
PRODUCT SPECIFICATIONS
PRODUCT SPECIFICATIONS
Support Item
Means / STD
Dead line check
Color Ratio
Uniformity
Dead pixel count
Cluster count
TMF /RMF
| Total 32 Channel SMU Per-channel Specification | |
|---|---|
| Channels | 0 through 3 |
| DC voltage range | ±10V |
| DC current source and sink ranges |
10µA 100µA 1mA 10mA 100mA |
| PXle-4139 Specification | |
|---|---|
| DC voltage range |
600mV 6V 60V |
| DC current source and sink ranges |
1µA 10µA 100µA 1mA 10mA 100mA 1A 3A 10A, pulse only |
